Digital systems testing and testable design : Abramovici, Miron
The solution to the "testability crisis" relies on three core pillars: controllability, observability, and repeatability. digital systems testing and testable design solution
Design for Testability (DFT) provides the solution to these complexity issues by adding specialized hardware to the circuit. The most pervasive DFT technique is Scan Design. In a scan-based system, traditional flip-flops are replaced with scan cells that can function as a shift register. This allows the tester to "shift in" a specific state to internal gates and "shift out" the results, effectively turning a complex sequential circuit into a simpler combinational one. Digital systems testing and testable design : Abramovici,